Characterization of Oval Defects in Crystalline Optical Coatings
Faculty Mentor Name
Ellie Gretarsson
Format Preference
Poster
Abstract
Crystalline AlGaAs optical coatings are candidates for future upgrades to gravitational wave (GW) detectors. These coatings are shown to significantly decrease noise in ultra-stable cavities in comparison to traditional amorphous coatings. However, large area AlGaAs coatings develop oval defects during the manufacturing process. This project aims to complete a systematic study of the surface of one of these coatings on a scale more similar to the tens of centimeters in diameter mirrors utilized in GW interferometry. By characterizing the size distributions of oval defects on the surface of crystalline optical coatings using scanning election microscopy (SEM), this project is gaining information on the nature of these defects.
Characterization of Oval Defects in Crystalline Optical Coatings
Crystalline AlGaAs optical coatings are candidates for future upgrades to gravitational wave (GW) detectors. These coatings are shown to significantly decrease noise in ultra-stable cavities in comparison to traditional amorphous coatings. However, large area AlGaAs coatings develop oval defects during the manufacturing process. This project aims to complete a systematic study of the surface of one of these coatings on a scale more similar to the tens of centimeters in diameter mirrors utilized in GW interferometry. By characterizing the size distributions of oval defects on the surface of crystalline optical coatings using scanning election microscopy (SEM), this project is gaining information on the nature of these defects.