individual
What campus are you from?
Daytona Beach
Authors' Class Standing
Ethan Damon, Junior
Lead Presenter's Name
Ethan Damon
Faculty Mentor Name
Seetha Raghavan
Abstract
A material’s response to specific environmental factors can be measured by quantifying peak shifts in X-ray diffraction (XRD) data. Aluminum oxide (Al2O3 or Alumina) has been extensively characterized via x-ray diffraction, leading to a wealth of existing research and data regarding its properties. Using alumina XRD data from a stressed sample, identifying load-induced peak shifts by comparing to an unstressed sample is an important step towards creating a workflow for strain analysis of arbitrary material. This research used high-energy synchrotron XRD data from Argonne National Laboratory of alumina in both an unstressed and stressed state applied through an external mechanical load. The data was then analyzed using MATLAB to identify specific alumina peaks and observe their shifts due to the applied load in specific azimuthal directions, which can be used to quantify lattice strain in the material. This same methodology can be utilized to analyze and quantify peak shifts in any material as a response to external factors such as an applied load, which allows for direct characterization of strain as a response to stress at a much greater accuracy and resolution than can be provided by mechanical testing, and an improved characterization of a material’s overall response to stress.
Did this research project receive funding support from the Office of Undergraduate Research.
No
Synchrotron X-ray Diffraction Analysis Methods for Quantifying Material Strain Response
A material’s response to specific environmental factors can be measured by quantifying peak shifts in X-ray diffraction (XRD) data. Aluminum oxide (Al2O3 or Alumina) has been extensively characterized via x-ray diffraction, leading to a wealth of existing research and data regarding its properties. Using alumina XRD data from a stressed sample, identifying load-induced peak shifts by comparing to an unstressed sample is an important step towards creating a workflow for strain analysis of arbitrary material. This research used high-energy synchrotron XRD data from Argonne National Laboratory of alumina in both an unstressed and stressed state applied through an external mechanical load. The data was then analyzed using MATLAB to identify specific alumina peaks and observe their shifts due to the applied load in specific azimuthal directions, which can be used to quantify lattice strain in the material. This same methodology can be utilized to analyze and quantify peak shifts in any material as a response to external factors such as an applied load, which allows for direct characterization of strain as a response to stress at a much greater accuracy and resolution than can be provided by mechanical testing, and an improved characterization of a material’s overall response to stress.